P-Type Gallium Nitride by Reactive Ion-Beam Molecular Beam Epitaxy with Ion Implantation, Diffusion or Coevaporation of Mg
Title | P-Type Gallium Nitride by Reactive Ion-Beam Molecular Beam Epitaxy with Ion Implantation, Diffusion or Coevaporation of Mg |
Publication Type | Journal Article |
Year of Publication | 1993 |
Authors | Michael D Rubin, Nathan Newman, James S Chan, T.C. Fu, Jennifer T Ross |
Journal | Applied Physics Letters |
Volume | 64 |
Start Page | 64 |
Issue | 1 |
Pagination | 64-66 |
ISSN | 0003-6951 |
Keywords | carrier density, carrier mobility, crystal doping, diffusion, evaporation, gallium nitrides, ion implantation, magnesium additions, molecular beam epitaxy, p−type conductors |
Abstract | Gallium nitride is one of the most promising materials for ultraviolet and blue light‐emitting diodes and lasers. The principal technical problem that limits device applications has been achieving controllable p‐type doping. Molecular beam epitaxy assisted by a nitrogen ion beam produced p‐type GaN when doped via ion implantation, diffusion, or coevaporation of Mg. Nearly intrinsic p‐type material was also produced without intentional doping, exhibiting hole carrier concentrations of 5×1011 cm−3 and hole mobilities of over 400 cm2/V/s at 250 K. This value for the hole mobility is an order of magnitude greater than previously reported. |
DOI | 10.1063/1.110870 |
LBNL Report Number | LBL-34413 |
Short Title | Appl. Phys. Lett. |