@article {11805,
	title = {Ellipsometry on Sputter Deposited Tin Oxide Films: Optical Constants Versus Stoichiometry Hydrogen Content, and Amount of Electrochemically Intercalated Lithium},
	journal = {Applied Optics},
	volume = {37},
	number = {31},
	year = {1998},
	pages = {7734-7741},
	abstract = {<p>Tin oxide thin films were deposited by reactive radio-frequency magnetron sputtering onto In<sub>2</sub>O<sub>3</sub>:Sn coated and bare glass substrates. Optical constants in the 300-2500 nm wavelength range were determined by a combination of variable-angle spectroscopic ellipsometry and spectrophotometric transmittance measurements. Surface roughness was modeled from optical measurements and compared with atomic-force microscopy. The two techniques gave consistent results. The fit between experimental optical data and model results could be significantly improved when it was assumed that the refractive index of the Sn oxide varied across the film thickness. Varying the oxygen partial pressure during deposition made it possible to obtain films whose complex refractive index changed at the transition from SnO to SnO<sub>2</sub>. An addition of hydrogen gas during sputtering led to lower optical constants in the full spectral range in connection with a blue shift of the band gap. Electrochemical intercalation of lithium ions into the Sn oxide films raised their refractive index and enhanced their refractive-index gradient.</p>},
	author = {Jan Isidorsson and Claes G. Granqvist and Klaus von Rottkay and Michael D. Rubin}
}
@article {12144,
	title = {Optical Constants of Sputter-Deposited Ti-Ce Oxide and Zr-Ce Oxide Films},
	journal = {Applied Optics},
	volume = {37},
	number = {25},
	year = {1998},
	month = {09/1998},
	pages = {5993-6001},
	chapter = {5993},
	abstract = {<p>Films of Ti oxide, Zr oxide, Ce oxide, Ti-Ce oxide, and Zr-Ce oxide were made by means of reactive dc magnetron sputtering in a multitarget arrangement. The films were characterized by x-ray diffraction and electrochemical measurements, both techniques being firmly connected to stoichiometric information. The optical constants n and k were evalued from spectrophotometry and from variable-angle spectroscopic ellipsometry. The two analyses gave consistent results. It was found that n for the mixed-oxide films varied smoothly between the values for the pure oxides, whereas k in the band-gap range showed characteristic differences between Ti-Ce oxide and Zr-Ce oxide. It is speculated that this difference is associated with structural effects.</p>},
	doi = {10.1364/AO.37.005993},
	author = {Monica Veszelei and Lisen Kullman and Claes G. Granqvist and Klaus von Rottkay and Michael D. Rubin}
}
